Testing and Evaluation of E-O Imaging Systems

Level: Intermediate Length: 7 hours Format: In-Person Lecture Intended Audience: The course is for managers, specification writers, and test engineers involved with all phases of imaging system characterization ranging from satisfying customer requirements to ensuring that specifications are unambiguous and testable. Description: As imaging technologies rapidly evolve, there's an increasing demand for professionals who can work across multiple platforms, understand the underlying assumptions of various tests, and ensure accurate measurements for inter-laboratory comparisons. By providing a thorough grounding in quantitative and qualitative metrics applicable to a wide range of imaging systems, this course promotes standardization and consistency in testing procedures. It bridges the gap between theory and practice, enabling professionals to adapt to technological advancements and make informed decisions about test applicability and limitations. The test concepts presented apply to CCD/CMOS cameras, intensified CCD cameras, night vision goggles, SWIR cameras, and infrared cameras. Using a linear systems approach, this course describes all the quantitative and qualitative metrics that are commonly used to characterize imaging system performance. Laboratory performance parameters discussed include spatial sampling (distortion), modulation transfer function (MTF), 3D noise, photon transfer curve (PTC), minimum resolvable temperature (MRT), and the minimum resolvable contrast (MRC), temporal response, quantum efficiency, and system of system level tests (latency etc.). Concepts related to data validation and setup verification are described along with many common best practices. Data reduction and analysis techniques are reviewed outlining many of the corresponding assumptions that must be met for accurate measurements. This course will also provide demonstrations of some of the common laboratory test techniques on commercially available thermal and color cameras. Learning Outcomes: This course will enable you to: - compare the differences between laboratory and field testing - write concise test procedures with unambiguous system specifications - discern the difference between poor system performance, peculiarities of the system under test, and measurement errors - appreciate the benefits and risks of fully automated testing - assess how sampling and other artifacts affect test results - identify all appropriate test parameters for different types of systems - get started with a camera and conduct basic laboratory tests - consider different assumptions necessary for reducing measurement data to metrics Instructor(s): David P. Haefner has been analyzing and developing new models and measurements for electro-optic imaging systems for over a decade for the U.S. Army Combat Capabilities Development Command C5ISR Center. Dr. Haefner holds a Ph.D. degree in optics from UCF’s CREOL in 2010, M.S. in electrical engineering (2014, signal and image processing), M.S. in mechanical engineering (2015 vibration of mechanical systems), and will complete an M.S in data analytics in 2025 all from CUA. He was selected for the SPIE Rising Researcher award in 2020 and has author over 20 journal articles and given 80 presentations on his work. Event: SPIE Defense + Commercial Sensing 2025 Course Held: 13 April 2025