MTF in Optical and Electro-Optical Systems

Level: Introductory Length: 7 hours Format: In-Person Lecture Intended Audience: Engineers, scientists, and managers who need to understand and apply the basic concepts of MTF to specifying, estimating, or characterizing performance. Some prior background in Fourier concepts is helpful. Description: Modulation transfer function (MTF) is used to specify the image quality achieved by an imaging system. It is useful in analysis of situations where several independent subsystems are combined. This course provides a background in the application of MTF techniques to performance specification, estimation and characterization of optical and electro-optical systems. Learning Outcomes: This course will enable you to: - explain the relationship between MTF, line response, and edge response functions - identify MTF contributions from finite detector size, crosstalk, charge transfer inefficiency, and electronics - list the basic assumptions of linear systems theory, including the concept of spatial frequency - estimate the MTF for both diffraction-limited and aberration-limited systems - identify relationship between impulse response, resolution, MTF, OTF, PTF, and CTF - summarize the effects of noise Instructor(s): Glenn D. Boreman served as the 2017 President of SPIE, and is Chair of the Department of Physics & Optical Science at the University of North Carolina at Charlotte. From 1984 to 2011 he was on the faculty of University of Central Florida. He received the BS in Optics from University of Rochester and PhD in Optics from University of Arizona. Prof. Boreman is coauthor of the graduate textbooks Infrared Detectors and Systems and Infrared Antennas and Resonant Structures, and author of Modulation Transfer Function in Optical & Electro-Optical Systems and Basic Electro-Optics for Electrical Engineers. He has published more than 200 journal articles in the areas of IR sensors, IR materials, and image-quality assessment, and has supervised 27 PhD students to completion. He is a fellow of SPIE, OSA, IEEE, and MSS. Event: SPIE Optics + Photonics 2022 Course Held: 21 August 2022