Optical Metrology for AR/VR/MR

Level: Intermediate Length: 4 hours Format: In-Person Lecture Intended Audience: Scientists, engineers, technicians, students or managers who wish to learn more about optical metrology for AR/VR/MR design verification and production qualification. Undergraduate training in engineering or science is assumed. Description: This course explains basic principles and applications of optical metrology for AR/VR/MR. A primary goal of the course is to reveal the logic of optical methodologies as being critical to the design verification and production yield improvement for this revolutionary consumer electronics product. The class will explore current AR/VR development challenges and how cutting-edge optical metrology technologies are used to boost this fast-growing industry. Out of this course the audience will be able to comfortably describe the fundamental demands of optical metrology for this industry and confidently define a solution path for a particular application. Learning Outcomes: This course will enable you to: - describe the fundamental optical architecture of AR/VR/MR product - identify critical optical performance for design verification and production quality control - classify essential optical parameters to define optical performance measurement - identify human vision optical standards and related optical calibration methods - list common optical metrology methodologies for a specific performance test - compare market available equipment and justify market driven customized technology development - design basic optical solution for specific product use case Instructor(s): Will Zhou , PhD is CTO of MLoptic Corp, leads MLUSA branch based in Seattle, WA and ML global R&D organization to develop optical total solutions for consumer electronics, semiconductor and autonomous industries. He created an international engineer team from the ground up and within three years grew it into more than 50 global technical talents from USA, China, and Israel, delivered 5 different optical metrology platforms specially covering the whole AR/VR optical metrology chain to support the design and manufacturing of various giant AR product companies. Dr. Zhou previously worked in Microsoft and delivered the 1st generation Hololens, and was responsible for mass production optical metrology, and in Rudolph Technology, delivered multiple generation Semiconductor Marco-defect inspection tools which are broadly utilized in global fabs including TSMC/Samsung etc. Dr. Zhou graduated from University of Minnesota and owns multiple international patents, publications, also served as the OSA Minnesota chapter 2011 president, and served on multiple SPIE conference committees. Event: SPIE Photonics West 2025 Course Held: 26 January 2025